X-ray Full Field Microscopy at 30 keV

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Full-field transmission x-ray microscopy at SSRL

A full-field hard-x-ray microscope at SSRL with 15 micron field of view and 40 nm resolution, as well as 3D tomographic capabilities, has successfully imaged samples of biological, environmental and astronomical origin. Spectroscopic imaging of a particle of comet dust from the NASA Stardust mission showed significantly more absorption contrast above the Fe K-edge, and tomography revealed the t...

متن کامل

Broadband X-ray full field microscopy at a superbend

Over the last decade, synchrotron-radiation based X-ray Tomographic Microscopy (SRXTM) has established itself as a fundamental tool for non-invasive, quantitative investigations of a broad variety of samples, with application ranging from space research and materials science to biology and medicine. The beamline for TOmographic Microscopy and Coherent rAdiology experimenTs (TOMCAT) has been rec...

متن کامل

Full-field transmission x-ray microscopy for bio-imaging.

A full-field hard-x-ray microscope at SSRL has successfully imaged samples of biological and environmental origin at 40 nm resolution. Phase contrast imaging of trabeculae from a female mouse tibia, loaded in vivo to study the effects of weight-bearing on bone structure, revealed a complex network of osteocytes and canaliculi. Imaging of cordgrass roots exposed to mercury revealed nanoparticles...

متن کامل

Three-dimensional full-field X-ray orientation microscopy

A previously introduced mathematical framework for full-field X-ray orientation microscopy is for the first time applied to experimental near-field diffraction data acquired from a polycrystalline sample. Grain by grain tomographic reconstructions using convex optimization and prior knowledge are carried out in a six-dimensional representation of position-orientation space, used for modelling t...

متن کامل

A Condenser Scanner for Artifact-Free, Large Field of View, Full-Field X-ray Microscopy at Synchrotrons

Most full-field microscopes at synchrotrons exhibit a highly peaked illumination in the center of the field of view for stationary condenser and objective optics. This illumination pattern is typically reference-corrected by division with an image without the sample to correct for the uneven illumination. However, this correction does not rectify problems such as the poor signal-to-noise ratio ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Physics: Conference Series

سال: 2014

ISSN: 1742-6596

DOI: 10.1088/1742-6596/499/1/012007